The present invention is a non-invasive method and associated apparatus for determining the junction temperature for an LED or laser diode (collectively “LED”). First a sample LED is placed in a heat chamber and the change of the LED's peak wavelength is recorded over time, as is the change in the temperature in the heat chamber. Since the heat chamber supplies the major component to the junction temperature, dwarfing the other components, it is a reasonable proxy for true junction temperature...
US-7651268-B2
US-7651268-B2 • January 2010 • Electronics & Technology
Method and testing equipment for LEDs and laser diodes